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Oct 29

Multi-Layer Deep xVA: Structural Credit Models, Measure Changes and Convergence Analysis

We propose a structural default model for portfolio-wide valuation adjustments (xVAs) and represent it as a system of coupled backward stochastic differential equations. The framework is divided into four layers, each capturing a key component: (i) clean values, (ii) initial margin and Collateral Valuation Adjustment (ColVA), (iii) Credit/Debit Valuation Adjustments (CVA/DVA) together with Margin Valuation Adjustment (MVA), and (iv) Funding Valuation Adjustment (FVA). Because these layers depend on one another through collateral and default effects, a naive Monte Carlo approach would require deeply nested simulations, making the problem computationally intractable. To address this challenge, we use an iterative deep BSDE approach, handling each layer sequentially so that earlier outputs serve as inputs to the subsequent layers. Initial margin is computed via deep quantile regression to reflect margin requirements over the Margin Period of Risk. We also adopt a change-of-measure method that highlights rare but significant defaults of the bank or counterparty, ensuring that these events are accurately captured in the training process. We further extend Han and Long's (2020) a posteriori error analysis to BSDEs on bounded domains. Due to the random exit from the domain, we obtain an order of convergence of O(h^{1/4-epsilon}) rather than the usual O(h^{1/2}). Numerical experiments illustrate that this method drastically reduces computational demands and successfully scales to high-dimensional, non-symmetric portfolios. The results confirm its effectiveness and accuracy, offering a practical alternative to nested Monte Carlo simulations in multi-counterparty xVA analyses.

  • 2 authors
·
Feb 20

Learning to Be a Transformer to Pinpoint Anomalies

To efficiently deploy strong, often pre-trained feature extractors, recent Industrial Anomaly Detection and Segmentation (IADS) methods process low-resolution images, e.g., 224x224 pixels, obtained by downsampling the original input images. However, while numerous industrial applications demand the identification of both large and small defects, downsampling the input image to a low resolution may hinder a method's ability to pinpoint tiny anomalies. We propose a novel Teacher--Student paradigm to leverage strong pre-trained features while processing high-resolution input images very efficiently. The core idea concerns training two shallow MLPs (the Students) by nominal images so as to mimic the mappings between the patch embeddings induced by the self-attention layers of a frozen vision Transformer (the Teacher). Indeed, learning these mappings sets forth a challenging pretext task that small-capacity models are unlikely to accomplish on out-of-distribution data such as anomalous images. Our method can spot anomalies from high-resolution images and runs way faster than competitors, achieving state-of-the-art performance on MVTec AD and the best segmentation results on VisA. We also propose novel evaluation metrics to capture robustness to defect size, i.e., the ability to preserve good localisation from large anomalies to tiny ones. Evaluating our method also by these metrics reveals its neatly superior performance.

  • 4 authors
·
Jul 4, 2024