Daily Papers

Many deep learning applications benefit from using large models with billions of parameters. Training these models is notoriously expensive due to the need for specialized HPC clusters. In this work, we consider alternative setups for training large models: using cheap "preemptible" instances or pooling existing resources from multiple regions. We analyze the performance of existing model-parallel algorithms in these conditions and find configurations where training larger models becomes less communication-intensive. Based on these findings, we propose SWARM parallelism, a model-parallel training algorithm designed for poorly connected, heterogeneous and unreliable devices. SWARM creates temporary randomized pipelines between nodes that are rebalanced in case of failure. We empirically validate our findings and compare SWARM parallelism with existing large-scale training approaches. Finally, we combine our insights with compression strategies to train a large Transformer language model with 1B shared parameters (approximately 13B before sharing) on preemptible T4 GPUs with less than 200Mb/s network.

IoT (Internet of Things) refers to the network of interconnected physical devices, vehicles, home appliances, and other items embedded with sensors, software, and connectivity, enabling them to collect and exchange data. IoT Forensics is collecting and analyzing digital evidence from IoT devices to investigate cybercrimes, security breaches, and other malicious activities that may have taken place on these connected devices. In particular, EM-SCA has become an essential tool for IoT forensics due to its ability to reveal confidential information about the internal workings of IoT devices without interfering these devices or wiretapping their networks. However, the accuracy and reliability of EM-SCA results can be limited by device variability, environmental factors, and data collection and processing methods. Besides, there is very few research on these limitations that affects significantly the accuracy of EM-SCA approaches for the crossed-IoT device portability as well as limited research on the possible solutions to address such challenge. Therefore, this empirical study examines the impact of device variability on the accuracy and reliability of EM-SCA approaches, in particular machine-learning (ML) based approaches for EM-SCA. We firstly presents the background, basic concepts and techniques used to evaluate the limitations of current EM-SCA approaches and datasets. Our study then addresses one of the most important limitation, which is caused by the multi-core architecture of the processors (SoC). We present an approach to collect the EM-SCA datasets and demonstrate the feasibility of using transfer learning to obtain more meaningful and reliable results from EM-SCA in IoT forensics of crossed-IoT devices. Our study moreover contributes a new dataset for using deep learning models in analysing Electromagnetic Side-Channel data with regards to the cross-device portability matter.

Efficient inference is critical for deploying deep learning models on edge AI devices. Low-bit quantization (e.g., 3- and 4-bit) with fixed-point arithmetic improves efficiency, while low-power memory technologies like analog nonvolatile memory enable further gains. However, these methods introduce non-ideal hardware behavior, including bit faults and device-to-device variability. We propose a regularization-based quantization-aware training (QAT) framework that supports fixed, learnable step-size, and learnable non-uniform quantization, achieving competitive results on CIFAR-10 and ImageNet. Our method also extends to Spiking Neural Networks (SNNs), demonstrating strong performance on 4-bit networks on CIFAR10-DVS and N-Caltech 101. Beyond quantization, our framework enables fault and variability-aware fine-tuning, mitigating stuck-at faults (fixed weight bits) and device resistance variability. Compared to prior fault-aware training, our approach significantly improves performance recovery under upto 20% bit-fault rate and 40% device-to-device variability. Our results establish a generalizable framework for quantization and robustness-aware training, enhancing efficiency and reliability in low-power, non-ideal hardware.